Transmission electron microscopy study of microdefects in...

Journal of Applied Physics 1979 Vol. 50; Iss. 5

Transmission electron microscopy study of microdefects in dislocation-free GaAs and InP crystals

Kamejima, Taibun, Matsui, Junji, Seki, Yasuo, Watanabe, Hisao
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Volume:
50
Year:
1979
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.326372
File:
PDF, 1.25 MB
english, 1979
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