Interpretation of double x-ray diffraction peaks from InGaN...

Applied Physics Letters 2001 Vol. 79; Iss. 10

Interpretation of double x-ray diffraction peaks from InGaN layers

Pereira, S., Correia, M. R., Pereira, E., O’Donnell, K. P., Alves, E., Sequeira, A. D., Franco, N.
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Volume:
79
Year:
2001
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.1397276
File:
PDF, 408 KB
english, 2001
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