Statistical analysis of AFM topographic images of...

Semiconductors 2013 / 07 Vol. 47; Iss. 7

Statistical analysis of AFM topographic images of self-assembled quantum dots

V. A. Sevriuk, P. N. Brunkov, I. V. Shalnev, A. A. Gutkin, G. V. Klimko, S. V. Gronin, S. V. Sorokin, S. G. Konnikov
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Volume:
47
Language:
english
DOI:
10.1134/S106378261307021X
Date:
July, 2013
File:
PDF, 535 KB
english, 2013
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