SPIE Proceedings [SPIE Aerospace/Defense Sensing and Controls - Orlando, FL (Monday 13 April 1998)] Thermosense XX - Advanced image processing for defect visualization in infrared thermography
Plotnikov, Yuri A., Winfree, William P., Snell, Jr., John R., Wurzbach, Richard N.Volume:
3361
Year:
1998
Language:
english
DOI:
10.1117/12.304745
File:
PDF, 2.30 MB
english, 1998