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[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Estimation of hardened flip-flop neutron soft error rates using SRAM multiple-cell upset data in bulk CMOS
Gaspard, N., Jagannathan, S., Diggins, Z., McCurdy, M., Loveless, T. D., Bhuva, B. L., Massengill, L. W., Holman, W. T., Oates, T. S., Fang, Y.-P, Wen, S.-J, Wong, R., Lilja, K., Bounasser, M.Year:
2013
Language:
english
DOI:
10.1109/IRPS.2013.6532113
File:
PDF, 546 KB
english, 2013