[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Program/erase speed, endurance, retention, and disturbance characteristics of single-poly embedded flash cells
Seung-Hwan Song,, Jongyeon Kim,, Kim, C. H.Year:
2013
Language:
english
DOI:
10.1109/IRPS.2013.6532095
File:
PDF, 896 KB
english, 2013