Highly accurate measurement of reflectivity and optical...

Electronics Letters 1998 Vol. 34; Iss. 17

Highly accurate measurement of reflectivity and optical absorption in distributed Bragg reflectors using wafer fused resonator

Berseth, C.A., Syrbu, A.V., Iakovlev, V.P., Dehaese, O., Rudra, A., Kapon, E.
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Volume:
34
Year:
1998
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19981148
File:
PDF, 289 KB
english, 1998
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