[IEEE 2013 18th IEEE European Test Symposium (ETS) -...

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[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Computing detection probability of delay defects in signal line tsvs

Metzler, C., Todri-Sanial, A., Bosio, A., Dilillo, L., Girard, P., Virazel, A., Vivet, P., Belleville, M.
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Year:
2013
Language:
english
DOI:
10.1109/ETS.2013.6569349
File:
PDF, 1.60 MB
english, 2013
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