![](/img/cover-not-exists.png)
[IEEE 2012 IEEE 17th Conference on Emerging Technologies & Factory Automation (ETFA 2012) - Krakow, Poland (2012.09.17-2012.09.21)] Proceedings of 2012 IEEE 17th International Conference on Emerging Technologies & Factory Automation (ETFA 2012) - Visual modeling of condition monitoring systems
Zygmunt, Maciej, Budyn, Marek, Orkisz, Michal, Ottewill, James, Jaramillo, Victor, Nowak, AgnieszkaYear:
2012
Language:
english
DOI:
10.1109/ETFA.2012.6489685
File:
PDF, 1.14 MB
english, 2012