Interface State Density of Single Vertical Nanowire MOS Capacitors
Mensch, P., Moselund, K. E., Karg, S., Lortscher, E., Bjork, M. T., Riel, H.Volume:
12
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/TNANO.2013.2248164
Date:
May, 2013
File:
PDF, 441 KB
english, 2013