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[IEEE 2011 IEEE International SOI Conference - Tempe, AZ, USA (2011.10.3-2011.10.6)] IEEE 2011 International SOI Conference - Novel analysis of impact of single dopants on sub-15nm channel length FDSOI NMOSFETs utilizing cryogenic measurements
Deshpande, V., Wacquez, R., Vinet, M., Jehl, X., Roche, B., Voisin, B., Sanquer, M., Mazurier, J., Weber, O., Tosti, L., Brevard, L., Perreau, P., Andrieu, F., Poiroux, T., Faynot, O.Year:
2011
Language:
english
DOI:
10.1109/SOI.2011.6081795
File:
PDF, 732 KB
english, 2011