Temperature Sensing for Power MOSFETs in Short-Duration Avalanche Mode
Azoui, Toufik, Tounsi, Patrick, Pasquet, G., Reynes, Jean-Michel, Pomes, Emilie, Dorkel, Jean-MarieVolume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2013.2260161
Date:
March, 2014
File:
PDF, 674 KB
english, 2014