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SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California (Sunday 21 August 2011)] Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V - IR nanoscale spectroscopy and imaging
Kennedy, Eamonn, Yarrow, Fiona, Rice, James H., Postek, Michael T.Volume:
8105
Year:
2011
Language:
english
DOI:
10.1117/12.892739
File:
PDF, 1.28 MB
english, 2011