SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San...

  • Main
  • SPIE Proceedings [SPIE SPIE NanoScience...

SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California (Sunday 21 August 2011)] Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V - IR nanoscale spectroscopy and imaging

Kennedy, Eamonn, Yarrow, Fiona, Rice, James H., Postek, Michael T.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
8105
Year:
2011
Language:
english
DOI:
10.1117/12.892739
File:
PDF, 1.28 MB
english, 2011
Conversion to is in progress
Conversion to is failed