[IEEE 2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - Wroclaw (2013.4.14-2013.4.17)] 2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - Comparative analysis of the thermal resistance profiles of power light-emitting diodes cree and rebel types
Zakgeim, A. L., Chernyakov, A. E., Vaskou, A. S., Kononenko, V. K., Niss, V. S.Year:
2013
Language:
english
DOI:
10.1109/EuroSimE.2013.6529922
File:
PDF, 1.96 MB
english, 2013