SPIE Proceedings [SPIE Defense and Security - Orlando, FL (Monday 28 March 2005)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X - Hardware-in-the-loop test facility for the standard missile-3 kinetic warhead
Patchan, Robert M., Murrer, Jr., Robert LeeVolume:
5785
Year:
2005
Language:
english
DOI:
10.1117/12.603870
File:
PDF, 851 KB
english, 2005