SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Infrared Technology and Applications XXXIX - Vertically integrated pixel microbolometers for IR imaging using high-resistivity VO x
Basantani, Hitesh A., Shin, Hang-Beum, Jackson, T. N., Horn, Mark W., Andresen, Bjørn F., Fulop, Gabor F., Hanson, Charles M., Norton, Paul R., Robert, PatrickVolume:
8704
Year:
2013
Language:
english
DOI:
10.1117/12.2016292
File:
PDF, 659 KB
english, 2013