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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Diagnostic Methods for Inorganic Materials II - Fourier transform spectrometer for thermal-infrared emissivity measurements near room temperatures
Ishii, Juntaro, Ono, Akira, Hanssen, Leonard M.Volume:
4103
Year:
2000
Language:
english
DOI:
10.1117/12.403578
File:
PDF, 392 KB
english, 2000