Investigation of deep defects in GaAs1−xPx by double light...

Investigation of deep defects in GaAs1−xPx by double light source PHCAP

Bizhong Zhou, Jingzhao Huang, Shibou Chen
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Volume:
40-41
Year:
1988
Language:
english
Pages:
2
DOI:
10.1016/0022-2313(88)90220-7
File:
PDF, 124 KB
english, 1988
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