AlGaN/GaN High Electron Mobility Transistor Structures:...

IEEE Transactions on Device and Materials Reliability 2008 / 09 Vol. 8; Iss. 3

AlGaN/GaN High Electron Mobility Transistor Structures: Self-Heating Effect and Performance Degradation

Vitusevich, Svetlana A., Kurakin, Andrey M., Klein, Norbert, Petrychuk, Mykhailo V., Naumov, Andrey V., Belyaev, Alexander E.
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Volume:
8
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2008.2001684
Date:
September, 2008
File:
PDF, 354 KB
english, 2008
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