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High resolution luminescence depth profiling of ion etched multiquantum well structures
R. Germann, A. Forchel, F. ScholzVolume:
40-41
Year:
1988
Language:
english
Pages:
2
DOI:
10.1016/0022-2313(88)90412-7
File:
PDF, 2.05 MB
english, 1988