The characteristic of acel in ZnS:Er3+ thin films grown by...

The characteristic of acel in ZnS:Er3+ thin films grown by atomic layer epitaxy method(ALE)

Lijian Meng, G.Z. Zhong
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Volume:
40-41
Year:
1988
Language:
english
Pages:
2
DOI:
10.1016/0022-2313(88)90438-3
File:
PDF, 387 KB
english, 1988
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