Deep electron traps and their changes during degradation in...

Deep electron traps and their changes during degradation in GaAs0.6P0.4 LEDs

Bo Huang, Qing Yuan
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Volume:
40-41
Year:
1988
Language:
english
Pages:
2
DOI:
10.1016/0022-2313(88)90449-8
File:
PDF, 452 KB
english, 1988
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