Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope
Hagedorn, Till, Ouali, Mehdi El, Paul, William, Oliver, David, Miyahara, Yoichi, GruÌtter, PeterVolume:
82
Year:
2011
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3660279
File:
PDF, 871 KB
english, 2011