Proton radiation damage in p-channel CCDs fabricated on high-resistivity silicon
Bebek, C., Groom, D., Holland, S., Karcher, A., Kolbe, W., Lee, J., Levi, M., Palaio, N., Turko, B., Uslenghi, M., Wagner, A., Wang, G.Volume:
49
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2002.1039641
Date:
June, 2002
File:
PDF, 215 KB
english, 2002