SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Micro- and Nanotechnology Sensors, Systems, and Applications V - Diffraction limit investigation with sub-wavelength pixels
Bergeron, A., George, Thomas, Islam, M. Saif, Terroux, M., Marchese, L., Dutta, Achyut K., Dufour, D., Le Noc, L., Chevalier, C.Volume:
8725
Year:
2013
Language:
english
DOI:
10.1117/12.2015627
File:
PDF, 951 KB
english, 2013