Thickness Dependence of Resistivity and Optical Reflectance...

Chinese Physics Letters 2008 / 04 Vol. 25; Iss. 4

Thickness Dependence of Resistivity and Optical Reflectance of ITO Films

Mei-Zhen, Gao, R, Job, De-Sheng, Xue, R, Fahrner W
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Volume:
25
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/25/4/059
Date:
April, 2008
File:
PDF, 3.78 MB
english, 2008
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