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SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and testing technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Defect study on several fluoride coatings
Zhang, Yaoping, Zhang, Yundong, Zhang, Yudong, Wyant, James C., Smythe, Robert A., Wang, HexinVolume:
7283
Year:
2009
Language:
english
DOI:
10.1117/12.828724
File:
PDF, 679 KB
english, 2009