Minority charge carrier lifetime mapping of crystalline silicon wafers by time-resolved photoluminescence imaging
Kiliani, David, Micard, Gabriel, Steuer, Benjamin, Raabe, Bernd, Herguth, Axel, Hahn, GisoVolume:
110
Year:
2011
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3630031
File:
PDF, 2.43 MB
english, 2011