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Dependence of Film Thickness on Properties of Al Doped ZnO Thin Films
Yang, Ying Ge, Zeng, Dong Mei, Zhou, Hai, Feng, Wen Ran, Lu, Shan, Feng, Wei BinVolume:
194-196
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.194-196.2305
Date:
February, 2011
File:
PDF, 886 KB
english, 2011