Quantitative Characterization of DNA Films by X-ray Photoelectron Spectroscopy
Petrovykh, Dmitri Y., Kimura-Suda, Hiromi, Tarlov, Michael J., Whitman, Lloyd J.Volume:
20
Language:
english
Journal:
Langmuir
DOI:
10.1021/la034944o
Date:
January, 2004
File:
PDF, 190 KB
english, 2004