Quantitative Characterization of DNA Films by X-ray...

Quantitative Characterization of DNA Films by X-ray Photoelectron Spectroscopy

Petrovykh, Dmitri Y., Kimura-Suda, Hiromi, Tarlov, Michael J., Whitman, Lloyd J.
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Volume:
20
Language:
english
Journal:
Langmuir
DOI:
10.1021/la034944o
Date:
January, 2004
File:
PDF, 190 KB
english, 2004
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