Quantitative analysis of silicate certified reference...

Journal of Analytical Atomic Spectrometry 2008 Vol. 23; Iss. 11

Quantitative analysis of silicate certified reference materials by LA-ICPMS with and without an internal standard

Gagnon, Joel E., Fryer, Brian J., Samson, Iain M., Williams-Jones, Anthony E.
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Volume:
23
Year:
2008
Language:
english
Journal:
Journal of Analytical Atomic Spectrometry
DOI:
10.1039/B801807N
File:
PDF, 133 KB
english, 2008
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