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SPIE Proceedings [SPIE Aerospace/Defense Sensing and Controls - Orlando, FL (Monday 13 April 1998)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III - Radiometric, noise, and spatial characterization of the wideband infrared scene projector

Marlow, Steven A., Flynn, David S., Kircher, James R., Murrer, Jr., Robert Lee
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Volume:
3368
Year:
1998
Language:
english
DOI:
10.1117/12.316363
File:
PDF, 1.97 MB
english, 1998
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