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Static and dynamic profiles of tethered polymer layers probed by analyzing the noise of an atomic force microscope
Roters, Andreas, Gelbert, Martin, Schimmel, Martin, Rühe, Jürgen, Johannsmann, DiethelmVolume:
56
Language:
english
Journal:
Physical Review E
DOI:
10.1103/PhysRevE.56.3256
Date:
September, 1997
File:
PDF, 177 KB
english, 1997