[IEEE 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2012.05.29-2012.06.1)] 2012 IEEE 62nd Electronic Components and Technology Conference - System-level SoC near-field (NF) emissions: Simulation to measurement correlation
Murugan, Rajen, Mukherjee, Souvik, Mi, Minhong, Pauc, Lionel, Girardi, Claudio, Gope, Dipanjan, De Araujo, Daniel, Chakraborty, Swagato, Jandhyala, VikramYear:
2012
Language:
english
DOI:
10.1109/ECTC.2012.6248819
File:
PDF, 1.74 MB
english, 2012