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SPIE Proceedings [SPIE Aerospace/Defense Sensing and Controls - Orlando, FL (Monday 8 April 1996)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing - Investigation of the optical sampling between the infrared resistor array projector and the unit under test for hardware-in-the-loop testing
Jones, Lawrence E., Olson, Eric M., Murrer, Jr., Robert Lee, Murrer, Jr., Robert LeeVolume:
2741
Year:
1996
Language:
english
DOI:
10.1117/12.241132
File:
PDF, 1013 KB
english, 1996