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[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - Test-Pattern Grading and Pattern Selection for Small-Delay Defects
Yilmaz, Mahmut, Chakrabarty, Krishnendu, Tehranipoor, MohammadYear:
2008
Language:
english
DOI:
10.1109/VTS.2008.32
File:
PDF, 490 KB
english, 2008