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[IEEE 2008 19th International Conference on Pattern Recognition (ICPR) - Tampa, FL, USA (2008.12.8-2008.12.11)] 2008 19th International Conference on Pattern Recognition - Counterfeit iris detection based on texture analysis
Zhuoshi Wei,, Xianchao Qiu,, Zhenan Sun,, Tieniu Tan,Year:
2008
Language:
english
DOI:
10.1109/ICPR.2008.4761673
File:
PDF, 645 KB
english, 2008