[American Institute of Aeronautics and Astronautics 45th AIAA Aerospace Sciences Meeting and Exhibit - Reno, Nevada ()] 45th AIAA Aerospace Sciences Meeting and Exhibit - Photogrammetric Recession Measurement of Ablative Materials During Arc-Jet Testing
Schairer, Edward, Heineck, JamesYear:
2007
Language:
english
DOI:
10.2514/6.2007-1158
File:
PDF, 1.61 MB
english, 2007