[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Impact of well contacts on the single event response of radiation-hardened 40-nm flip-flops
Chatterjee, Indranil, Jagannathan, Srikanth, Loveless, Daniel, Bhuva, Bharat L., Wen, Shi-Jie, Wong, Richard, Sachdev, ManojYear:
2012
Language:
english
DOI:
10.1109/IRPS.2012.6241929
File:
PDF, 802 KB
english, 2012