Interfacial structure and defect analysis of nonpolar ZnO films grown on R-plane sapphire by molecular beam epitaxy
VenneÌgueÌs, P., Chauveau, J. M., Korytov, M., Deparis, C., Zuniga-Perez, J., Morhain, C.Volume:
103
Year:
2008
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2905220
File:
PDF, 1.61 MB
english, 2008