[IEEE 2000 IEEE MTT-S International Microwave Symposium Digest - Boston, MA, USA (11-16 June 2000)] 2000 IEEE MTT-S International Microwave Symposium Digest (Cat. No.00CH37017) - A new simplified and reliable HEMT modelling approach using pinched cold FET S-parameters
Mwema, W.N., Kompa, G.Volume:
3
Year:
2000
Language:
english
DOI:
10.1109/MWSYM.2000.862234
File:
PDF, 332 KB
english, 2000