[IEEE 2012 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Design, Automation and Test - A 1-V, 44.6 ppm/°C bandgap reference with CDS technique
Peng-Yu Chen,, Soon-Jyh Chang,, Chung-Ming Huang,, Chin-Fu Lin,Year:
2012
Language:
english
DOI:
10.1109/VLSI-DAT.2012.6212660
File:
PDF, 843 KB
english, 2012