[IEEE International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (16-18 Oct. 2000)] ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) - Atomic force microscopy analysis of Ga-face and N-face GaN grown on Al/sub 2/O/sub 3/ (0001) by plasma-assisted molecular beam epitaxy

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