![](/img/cover-not-exists.png)
[IEEE 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Cap d'Agde, France (2005.09.19-2005.09.23)] 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Application of charge-coupled devices to multiple-bit-upset analysis in radiation environments
Platt, S. P., Torok, Z., Chugg, A. M., Moutrie, M. J., Burnell, A. J.Year:
2005
Language:
english
DOI:
10.1109/RADECS.2005.4365593
File:
PDF, 5.51 MB
english, 2005