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SPIE Proceedings [SPIE Holography Applications - Beijung, China (Wednesday 2 July 1986)] Holography Applications - Electronic Speckle Pattern Interferometry
Lokberg, Ole J., Ke, Jingtang, Pryputniewicz, Ryszard J.Volume:
673
Year:
1988
Language:
english
DOI:
10.1117/12.939087
File:
PDF, 4.76 MB
english, 1988