[IEEE 2010 International Conference on Microwave and Millimeter Wave Technology (ICMMT) - Chengdu, China (2010.05.8-2010.05.11)] 2010 International Conference on Microwave and Millimeter Wave Technology - Impact of bias current and geometry on noise performance of SiGe HBT low noise amplifier
Xie, Hongyun, Zhang, Wanrong, Shen, Pei, Chen, Liang, Sun, Botao, You, YunxiaYear:
2010
Language:
english
DOI:
10.1109/ICMMT.2010.5525235
File:
PDF, 109 KB
english, 2010