Single and Multiple Cell Upsets in 25-nm NAND Flash...

IEEE Transactions on Nuclear Science 2013 / 08 Vol. 60; Iss. 4

Single and Multiple Cell Upsets in 25-nm NAND Flash Memories

Bagatin, M., Gerardin, S., Paccagnella, A., Ferlet-Cavrois, V.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2273436
Date:
August, 2013
File:
PDF, 946 KB
english, 2013
Conversion to is in progress
Conversion to is failed