Experimental Estimation of the Window of Vulnerability for...

IEEE Transactions on Nuclear Science 2013 / 08 Vol. 60; Iss. 4

Experimental Estimation of the Window of Vulnerability for Logic Circuits

Mahatme, N. N., Gaspard, N. J., Jagannathan, S., Loveless, T. D., Chatterjee, I., Bhuva, B. L., Massengill, L. W., Schrimpf, R. D.
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2273740
Date:
August, 2013
File:
PDF, 846 KB
english, 2013
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