Magnetic Double Resonance in Force Microscopy

Magnetic Double Resonance in Force Microscopy

Lin, Qiong, Degen, Christian L., Tomaselli, Marco, Hunkeler, Andreas, Meier, Urban, Meier, Beat H.
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Volume:
96
Language:
english
Journal:
Physical Review Letters
DOI:
10.1103/PhysRevLett.96.137604
Date:
April, 2006
File:
PDF, 351 KB
english, 2006
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