[IEEE 2009 IEEE Asian Solid-State Circuits Conference...

  • Main
  • [IEEE 2009 IEEE Asian Solid-State...

[IEEE 2009 IEEE Asian Solid-State Circuits Conference (A-SSCC) - Taipei, Taiwan (2009.11.16-2009.11.18)] 2009 IEEE Asian Solid-State Circuits Conference - On-die parameter extraction from path-delay measurements

Takahashi, Tomoyuki, Uezono, Takumi, Shintani, Michihiro, Masu, Kazuya, Sato, Takashi
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2009
Language:
english
DOI:
10.1109/ASSCC.2009.5357189
File:
PDF, 571 KB
english, 2009
Conversion to is in progress
Conversion to is failed