![](/img/cover-not-exists.png)
[IEEE 2009 IEEE Asian Solid-State Circuits Conference (A-SSCC) - Taipei, Taiwan (2009.11.16-2009.11.18)] 2009 IEEE Asian Solid-State Circuits Conference - On-die parameter extraction from path-delay measurements
Takahashi, Tomoyuki, Uezono, Takumi, Shintani, Michihiro, Masu, Kazuya, Sato, TakashiYear:
2009
Language:
english
DOI:
10.1109/ASSCC.2009.5357189
File:
PDF, 571 KB
english, 2009